Real-Time Technique for Semiconductor Material Parameter Me… — ҚазҰУ

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Real-Time Technique for Semiconductor Material Parameter Measurement Under Continuous Neutron Irradiation with High Integral Fluence

2025 · Article

Жариялану жылы

2025

Дереккөз: Electronics (Switzerland)

DOI:

Scopus:

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Computer Networks and Communications Hardware and Architecture Signal Processing Control and Systems Engineering Electrical and Electronic Engineering